Scanning Electron Microscopy and X-Ray Microanalysis (4th 2018 edition)

by , ,

Write The First Customer Review
Show Synopsis

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, ...

Filter Results
Shipping
Item Condition
Seller Rating
Other Options
Change Currency

Customer Reviews

Write a Review


This item doesn't have extra editions

loading